Abstract: As the standardization of 5G solidifies, researchers are speculating what 6G will be. The integration of sensing functionality is emerging as a key feature of the 6G Radio Access Network ...
Abstract: A latch-type comparator with a dynamic bias pre-amplifier is implemented in a 65-nm CMOS process. The dynamic bias with a tail capacitor is simple to implement and ensures that the ...
Abstract: Alternative vehicles, such as plug-in hybrid electric vehicles, are becoming more popular. The batteries of these plug-in hybrid electric vehicles are to be charged at home from a standard ...
Abstract: Distributed Denial of Service (DDoS) attacks are one of the most harmful threats in today's Internet, disrupting the availability of essential services. The challenge of DDoS detection is ...
Abstract: In this article, in order to optimize the dynamic performance of the permanent magnet synchronous motor (PMSM) speed regulation system, a nonlinear speed-control algorithm for the PMSM ...
Abstract: The industrial Internet of Things (IoT) is a trend of factory development and a basic condition of intelligent factory. It is very important to ensure the security of data transmission in ...
Abstract: The propagation properties of the half-mode substrate integrated waveguide (HMSIW) are studied theoretically and experimentally in this paper. Two equivalent models of the HMSIW are ...
Abstract: Aerial manipulator, which is composed of an unmanned aerial vehicle (UAV) and a multilink manipulator and can perform aerial manipulation, has shown great potential of applications. However, ...
Abstract: This article introduces the design and imaging principles of the Advanced Hyperspectral Imager (AHSI) aboard China's GaoFen-5 satellite. The AHSI is a visible and nearinfrared ...
Abstract: We address the sparse signal recovery problem in the context of multiple measurement vectors (MMV) when elements in each nonzero row of the solution matrix are temporally correlated.
Abstract: The field of drug discovery has experienced a remarkable transformation with the advent of artificial intelligence (AI) and machine learning (ML) technologies. However, as these AI and ML ...
Abstract: Identification of the defective patterns of the wafer maps can provide insights for the quality control in the semiconductor wafer fabrication systems (SWFSs). In real SWFSs, the collected ...